Forgery Localization

Spotting the difference: Context retrieval and analysis for improved forgery detection and localization

2017 IEEE International Conference on Image Processing

Joel Brogan, Paolo Bestagini, Aparna Bharati, Allan Pinto, Daniel Moreira, Kevin Bowyer, Patrick Flynn, Anderson Rocha, Walter Scheirer

Spotting the difference: Context retrieval and analysis for improved forgery detection and localization